SM RTP 80 Surface measuring device

Main features: - Measuring range: ±500 µm (with TL90 transducer) - Resolution: 0.001 µm - Cut-off lengths: 0.25 mm, 0.8 mm, 2.5 mm, 8 mm - Number of cut-offs: Selectable from 1 to 19 - Measuring length: Up to 50 mm (with TL90 transducer) - Probe: Inductive, can be rotated by 90° for lateral measurements - Integrated printer: Thermal printer - Measuring parameters: 54 parameters, including Ra, Rq, Rt, Rz, Rp, Rc, Rv, Rsk, Rku, Rsm, Rdc, RPc, Pa, Pq, Pt, Pp, Pc, Pv, Psm, Pdc, PPc, Wa, Wq, Wt, Wz, Wp, Wv, Wc, WSm, Wdc, WPc, Rk, Rpk, Pvk, Mr1, Mr2, Pt, Pdc, PPc, R, Rx, AR, Wte, W, AW, Wx, Rke, Rpke, Rvke, Mr1e, Mr2e, Rmax, R3z, R3zm - Graphics displayed: Roughness, waviness, primary profile, material percentage curve and ordinate distribution - Units: mm and inches - Interface: 5.7-inch TFT color touchscreen and three waterproof membrane keys - Languages: Italian, French, English, German, Spanish, Portuguese - Memory: up to 1,000 measurements The RTP80 can be connected to up to four different probes, including: - TS7: Compact probe for measurements in difficult conditions, with a maximum measuring length of 25 mm. - TL90: Professional probe with internal metrological reference system, suitable for ripple parameters, with a maximum measuring length of 50 mm. - ROTARIX 55: Rotary module with horizontal axis for radial roughness measurements on medium-sized workpieces, suitable for diameters from 3 mm to 60 mm. - ROTARIX 125: Rotary module with vertical axis for radial roughness measurements on large workpieces, suitable for diameters from 10 mm to 160 mm. This device is suitable for use in both production environments and metrology laboratories and supports statistical analysis of the measurements taken.